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Select | Datasheet | Image | Model No | Manufacturer | Product | Description | Video | Country of Origin | Add to cart |
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FISCHERSCOPE X-RAY XDV-SDD | Helmut Fischer | X-ray fluorescence measuring instrument | X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of very thin Coatings and for Trace Analysis | Germany | Add to cart |
Update date & time: Aug-01st-2023 19:03
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